Author(s)

T. Arslan and A.A. Al-Jumah

Abstract

With the continuous increase in the complexity of electronic systems the issue of testing such systems is becoming an increasingly difficult task. The large number of constituent components on a printed circuit board and their internal complexity rules out traditional simulation-based techniques and emphasis upon using techniques which are based on artificial intelligence. This work is a continuation of research carried out by Arslan et al. [2] in which diagnosis is performed using example failure reports produced by Automatic Test Equipments (ATEs). The work of Arslan has also illustrated that expert system-based techniques could be used for the diagnosis procedure, however, the construction of expert systems is a lengthy procedure and their subsequent

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